Ar kodu EXTRA211,22 cena tikai €
234,69 €
Introduction to Focused Ion Beam Nanometrology
211,22 € 
- Mēs nosūtīsim 10-14 darba dienu laikā.
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
211.22
2025-06-02 08:00:00
/images/books/11791767/9781681740201.jpg)
- Autors: David C Cox
- Izdevējs MORGAN & CLAYPOOL
- Gads: 2015
- Lapas: 84
- ISBN-10 : 1681740206
- ISBN-13 : 9781681740201
- Formāts: 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Valoda: Anglų
- Extra -10% atlaide, ievadot kodu: EXTRA
Atsauksmes
Apraksts
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.10 EXTRA % atlaide
211,22 €
234,69 €
Mēs nosūtīsim 10-14 darba dienu laikā.
Kupona kods: EXTRA
Akcija beidzas 7d.02:24:27
Atlaides kods derīgs pirkumiem no 10 €. Atlaides nav kumulatīvas.
Derīgs tikai pirkumiem tiešsaistē.
- Autors: David C Cox
- Izdevējs MORGAN & CLAYPOOL
- Gads: 2015
- Lapas: 84
- ISBN-10: 1681740206
- ISBN-13: 9781681740201
- Formāts 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Valoda: Anglų
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Atsauksmes